Search results for "Atomic force acoustic microscopy"
showing 4 items of 4 documents
Combining Atomic Force Microscopy and Depth-Sensing Instruments for the Nanometer-Scale Mechanical Characterization of Soft Matter
2009
Complex materials exhibit a hierarchical structure where a gradient of features on nanometer scale is induced by the synthetic route eventually enhanced by the loading condition. The nanometer scale at which individual components arrange, determining their properties, is a current challenge of mechanical testing. In this work, a survey on nanoindentation is outlined based on the comparison of results obtained by Atomic Force Microscopy and Depth-Sensing Instruments and their combination. An Atomic Force Microscope equipped with a Force Transducer gives indeed the possibility to scan the sample surface in contact mode, thereby allowing one to choose a suitable position for the nanoindentatio…
Towards the origin of the shear force in near-field microscopy
2001
The shear force from a gold or a graphite sample acting on an approaching near-field optical probe is studied in detail. The adiabatic and dissipative contributions to the force are clearly distinguished by monitoring the amplitude as well as the phase of the tip vibration when the tip approaches the surfaces. We also take into account that not only the damping and the resonance frequency but also the mass of the system changes when the tip approaches the surface. The relative strength of the contributions to the force varies differently but characteristically with the distance of the two samples, starting at a much larger distance in the case of graphite. The adiabatic contribution is lar…
Lateral force microscopy of multiwalled carbon nanotubes
2009
Carbon nanotubes are usually imaged with the atomic force microscope (AFM) in non-contact mode. However, in many applications, such as mechanical manipulation or elasticity measurements, contact mode is used. The forces affecting the nanotube are then considerable and not fully understood. In this work lateral forces were measured during contact mode imaging with an AFM across a carbon nanotube. We found that, qualitatively, both magnitude and sign of the lateral forces to the AFM tip were independent of scan direction and can be concluded to arise from the tip slipping on the round edges of the nanotube. The dependence on the normal force applied to the tip and on the ratio between nanotub…
Modification of a commercial atomic force microscopy for low-noise, high-resolution frequency-modulation imaging in liquid environment.
2011
A key issue for high-resolution frequency-modulation atomic force microscopy imaging in liquids is minimizing the frequency noise, which requires a detailed analysis of the corresponding noise contributions. In this paper, we present a detailed description for modifying a commercial atomic force microscope (Bruker MultiMode V with Nanoscope V controller), aiming at atomic-resolution frequency-modulation imaging in ambient and in liquid environment. Care was taken to maintain the AFMs original stability and ease of operation. The new system builds upon an optimized light source, a new photodiode and an entirely new amplifier. Moreover, we introduce a home-built liquid cell and sample holder …